Date(s) – August 13, 2019
8:00 am – 4:00 pm
Learn about Overall Equipment Effectiveness (OEE) and how it relates to capacity. Apply TPM principles and techniques to equipment in a hands-on simulation and experience how applying TPM can achieve dramatic improvements in uptime and increased capacity.
- Define TPM
- Explain how TPM process is integrated with other lean tools
- Show how TPM fosters improvement efforts in safety, quality, delivery, cost and creativity by all employees
- Gather and analyze Overall Equipment Effectiveness (OEE) data to determine equipment constraints
- Define the six major equipment-related losses and how to minimize them in order to increase OEE
- Define the 8 pillars of TPM
- Apply aspects of TPM to simulation
Meet the Instructor:
Ed Hlava – Senior Productivity Specialist
Ed is an Advanced Manufacturing Specialist with the Purdue University Technical Assistance Program, Manufacturing Extension Partnership Center.
Positions included: Quality Assurance Manager, Customer Service Manager, Production Manager, Regional Operations Manager, and Plant Manager. Ed worked primarily in the Printing Industry for the Burroughs Corporation and Standard Register before joining Purdue University’s Technical Assistance Program. Prior responsibilities included continuous improvement development, profit and loss management, and operational growth. As a Lean/Six Sigma Champion, Black Belt mentor, and certified Green Belt, Ed has successfully applied these methodologies to prioritize, manage, develop and sustain process efficiencies.
Skills & Expertise:
Ed has over 25 years manufacturing management experience in both operations and a manufacturing environment. He has an AS degree in Printing Technology and BS degree in Printing Management from West Virginia University, Institute of Technology.
- Lean Bronze Certification from the Society of Manufacturing Engineers (SME)
- Association for Manufacturing Excellence (AME)
- The Shingo Prize for Excellence
- American Society for Quality (ASQ)
Registration is closed for this event.